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  Origin of Structural Modulations in Ultrathin Fe Films on Cu(001)

Zhang, X., Hickel, T., Rogal, J., & Neugebauer, J. (2017). Origin of Structural Modulations in Ultrathin Fe Films on Cu(001). Physical Review Letters, 118(23): 236101. doi:10.1103/PhysRevLett.118.236101.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-8C96-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-8C97-A
Genre: Journal Article

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 Creators:
Zhang, Xie1, Author           
Hickel, Tilmann1, Author           
Rogal, Jutta2, Author           
Neugebauer, Jörg3, Author           
Affiliations:
1Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863341              
2Interdisciplinary Centre for Advanced Materials Simulation, Ruhr-Universität Bochum, 44780 Bochum, Germany, ou_persistent22              
3Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337              

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Language(s): eng - English
 Dates: 2017-06-09
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevLett.118.236101
 Degree: -

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Title: Physical Review Letters
  Abbreviation : Phys. Rev. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Woodbury, N.Y. : American Physical Society
Pages: - Volume / Issue: 118 (23) Sequence Number: 236101 Start / End Page: - Identifier: ISSN: 0031-9007
CoNE: https://pure.mpg.de/cone/journals/resource/954925433406_1