Characterization of internal interfaces in Cu(In,Ga)Se2 thin-film solar cells 
using Atom Probe Tomography

Cojocaru-Mirédin, O.; Choi, P.; Abou-Ras, D.; Wuerz, R.; Liu, T.; Schmidt, S. S.; Caballero, R.; Raabe, D.

Local TagsRelease HistoryDetailsSummary

Characterization of internal interfaces in Cu(In,Ga)Se₂ thin-film solar cells using Atom Probe Tomography

Cojocaru-Mirédin, O., Choi, P., Abou-Ras, D., Wuerz, R., Liu, T., Schmidt, S. S., et al. (2011). Characterization of internal interfaces in Cu(In,Ga)Se₂ thin-film solar cells using Atom Probe Tomography. Talk presented at Euromat 2011. Montpellier, France. 2011-09-12 - 2011-09-15.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2FDB-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2FDD-2

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Cojocaru-Mirédin, O.¹, Author
Choi, P.¹, Author
Abou-Ras, D., Author
Wuerz, R., Author
Liu, T.², Author
Schmidt, S. S., Author
Caballero, R., Author
Raabe, D.³, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 572693

Degree: -

Event

show

hide

Title: Euromat 2011

Place of Event: Montpellier, France

Start-/End Date: 2011-09-12 - 2011-09-15

Legal Case

show

Project information

show

Source

show