Charged Point Defects in Semiconductors

Freysoldt, C.; Neugebauer, J.

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Charged Point Defects in Semiconductors

Freysoldt, C., & Neugebauer, J. (2007). Charged Point Defects in Semiconductors. Talk presented at PAW workshop 2007. Goslar, Germany. 2007-10-15 - 2007-10-17.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4F72-3 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4F74-0

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Urheber:
Freysoldt, C.¹, Autor
Neugebauer, J.², Autor

Affiliations:
1Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863342
2Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337