TEM-Observation of Dislocations in Polycrystalline Metal Films

Dehm, Gerhard; Müllner, Peter

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TEM-Observation of Dislocations in Polycrystalline Metal Films

Dehm, G., & Müllner, P. (2001). TEM-Observation of Dislocations in Polycrystalline Metal Films. In K. Buschow, R. Cahn, M. Flemings, B. Ilschner, E. Kramer, & S. Mahajan (Eds.), The Encyclopedia of Materials: Science and Technology (pp. 2329-2331).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-2827-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-2828-9

Genre: Book Chapter

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Creators:
Dehm, Gerhard¹, Author
Müllner, Peter¹, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655

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Dates: Date issued: 2001

Publication Status: Issued

Pages: 3

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Title: The Encyclopedia of Materials: Science and Technology

Source Genre: Book

Creator(s):
Mahajan, Subhash, Author
Buschow, K.H.J., Editor
Cahn, Robert, Editor
Flemings, Merton, Editor
Ilschner, Bernhard, Editor
Kramer, Edward , Editor
Mahajan, Subhash, Editor
Veyssiere, Patrick, Author

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-

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Pages: 10388 Volume / Issue: 1 Sequence Number: - Start / End Page: 2329 - 2331 Identifier: -