Depth Analysis of Thin Films with an Ion Microprobe

Hofer, W.O.; Liebl, H.; Staudenmaier, G.

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Depth Analysis of Thin Films with an Ion Microprobe

Hofer, W., Liebl, H., & Staudenmaier, G. (1975). Depth Analysis of Thin Films with an Ion Microprobe. In 148. Meeting of the Electrochemical Society (pp. 243).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C87C-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C87D-0

Genre: Conference Paper

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Creators:
Hofer, W.O.¹, Author
Liebl, H.², Author
Staudenmaier, G.², Author

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Dates: Date issued: 1975

Publication Status: Issued

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Title: 148. Meeting of the Electrochemical Society

Place of Event: Princeton, NJ(US)

Start-/End Date: 1975-10-05 - 1975-10-10

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Title: 148. Meeting of the Electrochemical Society

Source Genre: Proceedings

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 243 Identifier: -