English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Electron Energy-Loss Spectroscopy at Cu/Al2O3 and Ti/Al2O3 Interfaces

Scheu, C., Dehm, G., Müllejans, H., & Rühle, M. (1996). Electron Energy-Loss Spectroscopy at Cu/Al2O3 and Ti/Al2O3 Interfaces. Materials Science Forum, 207-209(1), 181-184. doi:10.4028/www.scientific.net/MSF.207-209.181.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Scheu, Christina1, Author           
Dehm, Gerhard2, Author           
Müllejans, Harald1, Author           
Rühle, Manfred1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 1996
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Materials Science Forum
  Abbreviation : Mater. Sci. Forum
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 207-209 (1) Sequence Number: - Start / End Page: 181 - 184 Identifier: ISSN: 0255-5476
CoNE: https://pure.mpg.de/cone/journals/resource/954928550320