Understanding TWIP steel microstructures by using advanced electron microscopy 
and ab initio predictions

Gutierrez-Urrutia, I.; Dick, A.; Hickel, T.; Neugebauer, J.; Raabe, D.

Local TagsRelease HistoryDetailsSummary

Understanding TWIP steel microstructures by using advanced electron microscopy and ab initio predictions

Gutierrez-Urrutia, I., Dick, A., Hickel, T., Neugebauer, J., & Raabe, D. (2011). Understanding TWIP steel microstructures by using advanced electron microscopy and ab initio predictions. Talk presented at International Conference on Processing & Manufacturing of Advanced Materials THERMEC 2011. Québec City, QC, Canada. 2011-08-01 - 2011-08-05.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3090-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-402F-6

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Gutierrez-Urrutia, I.¹, Author
Dick, A.², Author
Hickel, T.³, Author
Neugebauer, J.⁴, Author
Raabe, D.¹, Author

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
2Precipitation and Kinetics, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863345
3Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863341
4Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337

Content

show

Details

show

hide

Language(s): eng - English

Dates: Created: 2011-08

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 572686

Degree: -

Event

show

hide

Title: International Conference on Processing & Manufacturing of Advanced Materials THERMEC 2011

Place of Event: Québec City, QC, Canada

Start-/End Date: 2011-08-01 - 2011-08-05

Invited: Yes

Legal Case

show

Project information

show

Source

show