Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). Evolution of faceted voids and fingering instabilities in a model thin film system - Insights by in-situ environmental scanning electron microscopy. Talk presented at Symposium - In situ Microscopy with Electrons, X‐rays and Scanning Probes, Universität Erlangen‐Nürnberg. Erlangen, Germany. 2017-10-09.