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  Nanostructure characterization of iron catalyst assisted SiC nanowires

Liu, Z., Srot, V., van Aken, P. A., Yang, J. C., & Rühle, M. (2007). Nanostructure characterization of iron catalyst assisted SiC nanowires. In M. Marko, H. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, et al. (Eds.), Microscopy and Microanalysis 2007 (pp. 754CD-755CD). New York, USA: Cambridge University Press.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-43B9-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-43BA-B
Genre: Conference Paper

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 Creators:
Liu, Z.1, Author           
Srot, V.2, Author           
van Aken, P. A.2, Author           
Yang, J. C.3, Author
Rühle, M.4, Author           
Affiliations:
1Former Dept. Theory of Mesoscopic Phenomena, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497656              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
3Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA,USA, ou_persistent22              
4Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
 Abstract: -

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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 319197
 Degree: -

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Title: Microscopy and Microanalysis 2007
Place of Event: Fort Lauderdale, Florida, USA
Start-/End Date: 2007-08-05 - 2007-08-09

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Title: Microscopy and Microanalysis 2007
Source Genre: Proceedings
 Creator(s):
Marko, M., Editor
Scott, H., Editor
Vicenzi, E., Editor
Dekanich, S., Editor
Frafjord, J., Editor
Kotula, P., Editor
McKernan, S., Editor
Shields, J., Editor
Affiliations:
-
Publ. Info: New York, USA : Cambridge University Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 754CD - 755CD Identifier: -