Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM 
imaging techniques

Kelm, Klemens; Irsen, Stephan H.; Quandt, Eckhard; Paninski, M.; Drevermann, Anne; Schmitz, Georg J.; Palm, Martin; Stein, Frank; Heilmaier, Martin; Engberding, Nico; Saage, Holger; Sturm, Daniel

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Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM imaging techniques

Kelm, K., Irsen, S. H., Quandt, E., Paninski, M., Drevermann, A., Schmitz, G. J., et al. (2007). Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM imaging techniques. Talk presented at 33rd Conference of the DGE Deutsche Gesellschaft für Elektronenmikroskopie e.V. Saarbrücken, Germany. 2007-09-02 - 2007-09-07.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5177-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-F29A-8

Genre: Talk

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Creators:
Kelm, Klemens¹, Author
Irsen, Stephan H.², Author
Quandt, Eckhard³, Author
Paninski, M.⁴, Author
Drevermann, Anne⁵, Author
Schmitz, Georg J.⁵, Author
Palm, Martin⁶, Author
Stein, Frank⁶, Author
Heilmaier, Martin⁷, Author
Engberding, Nico⁶, Author
Saage, Holger⁷, Author
Sturm, Daniel⁸, Author

Affiliations:
1Stiftung caesar, Electron Microscopy, Bonn, Germany, ou_persistent22
2Research Center Caesar, Ludwig-Erhard-Allee 2, D-53175 Bonn, Germany, ou_persistent22
3Center of Advanced European Studies and Research (caesar), Ludwig-Erhard-Allee 2, 53175 Bonn, Germany, ou_persistent22
4ACCESS e.V., Intzestraße 5, D-52072 Aachen, Germany, ou_persistent22
5ACCESS e.V., D-52072 Aachen, Germany, ou_persistent22
6Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863368
7Otto-von-Guericke-Universität Magdeburg, Institut für Werkstoff- und Fügetechnik, Lehrstuhl Werkstoffprüftechnik, Grobe Steinernetischstrabe 6, Magdeburg, Germany, ou_persistent22
8Otto-von-Guericke University Magdeburg, Institute for Materials Joining and Technology, D-39104 Magdeburg, Germany, ou_persistent22

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Language(s): eng - English

Dates: Created: 2007-09

Publication Status: Not specified

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Identifiers: eDoc: 343267

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Title: 33rd Conference of the DGE Deutsche Gesellschaft für Elektronenmikroskopie e.V.

Place of Event: Saarbrücken, Germany

Start-/End Date: 2007-09-02 - 2007-09-07

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