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  Cross-sectional TEM study on metal/carbon nanotube interface

Jin-Phillipp, N., Kelsch, M., Sycha, M., Thomas, J., & Rühle, M. (2004). Cross-sectional TEM study on metal/carbon nanotube interface. In I. Anderson, R. Price, E. Hall, E. Clark, & S. McKernan (Eds.), Proceedings Microscopy and Microanalysis 2004, Suppl. 2 (pp. 280CD-281CD). New York, USA: Press Syndicate of the University of Cambridge.

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 Creators:
Jin-Phillipp, N.Y.1, 2, 3, Author           
Kelsch, M.1, 3, Author           
Sycha, M.1, 4, Author           
Thomas, J.1, 2, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
4Dept. New Materials and Biosystems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497649              

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Free keywords: MPI für Metallforschung; MPI für Metallforschung; Abt. Rühle; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;
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Language(s): eng - English
 Dates: 2004-08
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 194925
 Degree: -

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Title: Microscopy and Microanalysis 2004
Place of Event: Savannah, Georgia, USA
Start-/End Date: 2004-08-01 - 2004-08-05

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Title: Proceedings Microscopy and Microanalysis 2004, Suppl. 2
Source Genre: Proceedings
 Creator(s):
Anderson, I.M., Editor
Price, R., Editor
Hall, E., Editor
Clark, E., Editor
McKernan, S., Editor
Affiliations:
-
Publ. Info: New York, USA : Press Syndicate of the University of Cambridge
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 280CD - 281CD Identifier: -