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  Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION

Butz, T., Meinecke, C., Morawski, M., Reinert, T., Schwertner, M., Spemann, D., et al. (2005). Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION. Applied Surface Science, 252(1), 43-48. doi:10.1016/j.apsusc.2005.01.101.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0004-C6DD-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0004-C6DE-3
Genre: Journal Article

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 Creators:
Butz, T.1, Author
Meinecke, Ch.1, Author
Morawski, Markus1, Author           
Reinert, Tilo1, Author           
Schwertner, M.1, Author
Spemann, D.1, Author
Vogt, J.1, Author
Affiliations:
1Nukleare Festkörperphysik, Fakultät für Physik und Geowissenschaften, University of Leipzig, Germany, ou_persistent22              

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Free keywords: Ion probe; Particle induced X-ray emission (PIXE); Rutherford backscattering spectrometry (RBS); Thin films
 Abstract: This contribution deals with the morphological and elemental characterisation with high--energy (MeV) focused ion beams (in particular protons) with special emphasis on high spatial resolution in the sub--micrometer regime and very low...

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Language(s): eng - English
 Dates: 2005-03-052005-09-30
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.apsusc.2005.01.101
BibTex Citekey: Butz:2005
 Degree: -

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Title: Applied Surface Science
  Abbreviation : Appl. Surf. Sci.
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 252 (1) Sequence Number: - Start / End Page: 43 - 48 Identifier: ISSN: 0169-4332
CoNE: https://pure.mpg.de/cone/journals/resource/954928576736