EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films 
Deposited on MgO Substrates

Rashkova, Boryana; Zhang, Zaoli; Šturm, Sašo; Kothleitner, Gerald; Kutschej, Kerstin; Mitterer, Christian; Lazar, Petr; Redinger, Josef; Podloucky, Raimund; Scheu, Christina; Dehm, Gerhard

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EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates

Rashkova, B., Zhang, Z., Šturm, S., Kothleitner, G., Kutschej, K., Mitterer, C., et al. (2009). EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In G. Kothleitner (Ed.), 9th Multinational Microscopy Conference 2009 (pp. 285-286). Graz, Austria: Verlag der Technischen Universität Graz.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-5556-F Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6D46-7

Genre: Conference Paper

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Creators:
Rashkova, Boryana^{1, 2}, Author
Zhang, Zaoli³, Author
Šturm, Sašo⁴, Author
Kothleitner, Gerald⁵, Author
Kutschej, Kerstin⁶, Author
Mitterer, Christian⁷, Author
Lazar, Petr⁸, Author
Redinger, Josef⁸, Author
Podloucky, Raimund⁹, Author
Scheu, Christina¹⁰, Author
Dehm, Gerhard^{1, 2}, Author

Affiliations:
1Erich-Schmid-Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, 8700 Leoben, Austria, ou_persistent22
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
3Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
4Institut Jožef Stefan, Department for Nanostructured Materials, Ljubljana, Slovenia, ou_persistent22
5Institut für Elektronenmikroskopie und Nanoanalytik, Technische Universität Graz, Austria, ou_persistent22
6Department of Physical Metallurgy and Materials Testing, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria, ou_persistent22
7Department of Physical Metallurgy and Materials Testing, Christian-Doppler Laboratory for Advanced Coatings, University of Leoben, Austria, ou_persistent22
8Institute of Applied Physics, Vienna University of Technology, Vienna, Austria, ou_persistent22
9Department of Physical Chemistry, Vienna University, Vienna, Austria, ou_persistent22
10Department Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Str. 18, 8700 Leoben, Austria, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: URI: www.univie.ac.at/asem

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Title: 9th Multinational Microscopy Conference 2009

Place of Event: Graz, Austria

Start-/End Date: 2009-08-30 - 2008-09-04

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Title: 9th Multinational Microscopy Conference 2009

Source Genre: Proceedings

Creator(s):
Kothleitner, Gerald¹, Editor
Leisch, Manfred², Author

Affiliations:
1 Institut für Elektronenmikroskopie und Nanoanalytik, Technische Universität Graz, Austria, ou_persistent22
2 Institute for Solid State Physics, Technische Universitat Graz, Austria, ou_persistent22

Publ. Info: Graz, Austria : Verlag der Technischen Universität Graz

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 285 - 286 Identifier: -