English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
 Local TagsRelease HistoryDetailsSummary
  Multiple ionization in strong fields

Rudenko, A., Moshammer, R., Schröter, C. D., Zrost, K., Feuerstein, B., de Jesus, V. L. B., et al. (2005). Multiple ionization in strong fields. In B. Piraux (Ed.), Electron and Photon Impact Ionization and Related Topics 2004. Proceedings of the International Conference. (pp. 93-102). Bristol and Philadelphia: Institute of Physics.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-89F0-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-89F1-3
Genre: Conference Paper

Files

show Files
hide Files
:
Louvain_Ullrich.doc (Preprint), 271KB
View   Save
File Permalink:
https://hdl.handle.net/11858/00-001M-0000-0011-89EF-B
Name:
Louvain_Ullrich.doc
Description:
-
OA-Status:
Visibility:
Public
MIME-Type / Checksum:
application/msword / [MD5]
Technical Metadata:
View
Copyright Date:
-
Copyright Info:
eDoc_access: PUBLIC
License:
-

Locators

show

Creators

show
hide
 Creators:
Rudenko, A.1, Author           
Moshammer, R.1, Author           
Schröter, C. D.1, Author           
Zrost, K.1, Author           
Feuerstein, B.1, Author           
de Jesus, V. L. B.1, Author           
Ullrich, J.1, Author           
Affiliations:
1Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              

Content

show
hide
Free keywords: -
 Abstract: Single and multiple ionization of rare gas atoms by 25 and 7 fs intense laser pulses has been studied using a "Reaction Microscope”. For single ionization of He, Ne and Ar in the tunnelling regime, surprising and distinct patterns have been observed in high-resolution low-energy electron spectra. Mechanisms of double and multiple ionization were elucidated and partly identified via recoil-ion momentum distributions and correlated electron spectra. For Ne the highly correlated “instantaneous” emission of up to four electrons is triggered by a recollisional electron impact, whereas in multiple ionization of Ar different mechanisms involving field ionization steps and recollision-induced excitations play a major role.

Details

show
hide
Language(s): eng - English
 Dates: 2005
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 206687
 Degree: -

Event

show
hide
Title: International Conference on Electron and Photon Impact Ionization and Related Topics
Place of Event: Louvain-la-Neuve, Belgium
Start-/End Date: 2004-07-01 - 2004-07-03

Legal Case

show

Project information

show

Source 1

show
hide
Title: Electron and Photon Impact Ionization and Related Topics 2004. Proceedings of the International Conference.
Source Genre: Proceedings
 Creator(s):
Piraux, B., Editor
Affiliations:
-
Publ. Info: Bristol and Philadelphia : Institute of Physics
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 93 - 102 Identifier: -

Source 2

show
hide
Title: Institute of Physics Conference Series
Source Genre: Series
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 183 Sequence Number: - Start / End Page: - Identifier: -