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  Electron holography of thin amorphous carbon films: Measurement of the mean inner potential and a thickness-independent phase shift

Wanner, M., Bach, D., Gerthsen, D., Werner, R., & Tesche, B. (2006). Electron holography of thin amorphous carbon films: Measurement of the mean inner potential and a thickness-independent phase shift. Ultramicroscopy, 106, 341-345. doi:10.1016/j.ultramic.2005.10.004.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-93CF-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C59C-5
Genre: Journal Article

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 Creators:
Wanner, M.1, Author
Bach, D.1, Author
Gerthsen, D.1, Author
Werner, R.1, Author
Tesche, B.2, Author           
Affiliations:
1Univ Karlsruhe, Lab Elektronenmikroskopie, Karlsruhe, Germany.; Univ Karlsruhe, Inst Theorie Kondensierten Mat, D-76128 Karlsruhe, Germany, ou_persistent22              
2Service Department Tesche (EM), Max-Planck-Institut für Kohlenforschung, Max Planck Society, ou_1445631              

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Free keywords: transmission electron microscopy; electron holography; mean inner coulomb potential; surface potential; amorphous carbon; electron energy-loss spectroscopy
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 300377
DOI: 10.1016/j.ultramic.2005.10.004
ISI: 000236042300013
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Title: Ultramicroscopy
  Alternative Title : Ultramicroscopy
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 106 Sequence Number: - Start / End Page: 341 - 345 Identifier: ISSN: 0304-3991