Atom-Probe Tomography of compound semiconductors for photovoltaic and 
light-emitting device applications

Choi, P.; Cojocaru-Mirédin, O.; Abou-Ras, D.; Caballero, R.; Raabe, D.; Smentkowski, V.; Park, C. G.; Gu, G. H.; Mazumder, B.; Wong, M. H.; Hu, Y.-L.; Melo, T. P.; Speck, J. S.

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Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications

Choi, P., Cojocaru-Mirédin, O., Abou-Ras, D., Caballero, R., Raabe, D., Smentkowski, V., et al. (2012). Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications. Microscopy Today, 20(3), 18-24.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2CAF-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2CB1-7

Genre: Journal Article

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Creators:
Choi, P.¹, Author
Cojocaru-Mirédin, O.¹, Author
Abou-Ras, D., Author
Caballero, R., Author
Raabe, D.², Author
Smentkowski, V., Author
Park, C. G., Author
Gu, G. H., Author
Mazumder, B., Author
Wong, M. H., Author
Hu, Y.-L., Author
Melo, T. P., Author
Speck, J. S., Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Date issued: 2012

Publication Status: Issued

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Identifiers: eDoc: 611054

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Title: Microscopy Today

Source Genre: Journal

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Pages: - Volume / Issue: 20 (3) Sequence Number: - Start / End Page: 18 - 24 Identifier: -