High-performance x-ray detector for appearance potential spectroscopy

Rangelov, G.; Ertl, K.; Passek, F.; Vonbank, M.; Bassen, S.; Reinmuth, J.; Donath, M.; Dose, V.

doi:10.1116/1.581416

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High-performance x-ray detector for appearance potential spectroscopy

Rangelov, G., Ertl, K., Passek, F., Vonbank, M., Bassen, S., Reinmuth, J., et al. (1998). High-performance x-ray detector for appearance potential spectroscopy. Journal of Vacuum Science & Technology A: Vacuum Surfaces and Films, 16(4), 2738-2741. doi:10.1116/1.581416.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8837-1 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-8838-0

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Urheber:
Rangelov, G.¹, Autor
Ertl, K.¹, Autor
Passek, F.², Autor
Vonbank, M.¹, Autor
Bassen, S.³, Autor
Reinmuth, J.¹, Autor
Donath, M.¹, Autor
Dose, V.¹, Autor

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2External Organizations, ou_persistent22
3Max Planck Society, ou_persistent13