Characterization of Nanostructured Electrodeposited NiCo Samples by use of 
Electron Backscatter Diffraction (EBSD)

Bastos, A.; Zaefferer, S.; Raabe, D.

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Characterization of Nanostructured Electrodeposited NiCo Samples by use of Electron Backscatter Diffraction (EBSD)

Bastos, A., Zaefferer, S., & Raabe, D. (2005). Characterization of Nanostructured Electrodeposited NiCo Samples by use of Electron Backscatter Diffraction (EBSD). Talk presented at Conference on Textures of Materials ICOTOM 14. Leuven, Belgium. 2005-07.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5F37-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5F39-6

Genre: Talk

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Creators:
Bastos, A., Author
Zaefferer, S.¹, Author
Raabe, D.², Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

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Identifiers: eDoc: 287847

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Title: Conference on Textures of Materials ICOTOM 14

Place of Event: Leuven, Belgium

Start-/End Date: 2005-07

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