English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Emission and Laser Spectroscopy of Trapped Highly Charged Ions in Electron Beam Ion Traps

Crespo López-Urrutia, J. R., & Harman, Z. (2014). Emission and Laser Spectroscopy of Trapped Highly Charged Ions in Electron Beam Ion Traps. In W. Quint, & M. Vogel (Eds.), Fundamental Physics in Particle Traps (pp. 315-373). Berlin u.a.: Springer.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Crespo López-Urrutia, José Ramón1, Author           
Harman, Zoltan2, Author           
Affiliations:
1Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              
2Division Prof. Dr. Christoph H. Keitel, MPI for Nuclear Physics, Max Planck Society, ou_904546              

Content

show
hide
Free keywords: -
 MPINP: Research group Z. Harman – Division C. H. Keitel
 Abstract: Research with highly charged ions addresses bound state quantum electrodynamics and relativistic atomic theory at their frontiers. Electron beam ion traps have provided practical means to study not only these fundamental fields, but also the physics of extremely hot plasmas in stars, active galactic nuclei, and fusion research plasma devices. Starting from the X-ray region, where the first experiments took place, this chapter will visit various regions of the electromagnetic spectrum and give a review of essential contributions of different groups to this field.

Details

show
hide
Language(s):
 Dates: 2014-02
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1007/978-3-642-45201-7_10
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Fundamental Physics in Particle Traps
Source Genre: Book
 Creator(s):
Quint, Wolfgang, Editor
Vogel, Manuel, Editor
Affiliations:
-
Publ. Info: Berlin u.a. : Springer
Pages: XV, 411 S. : Ill., graph. Darst. Volume / Issue: - Sequence Number: - Start / End Page: 315 - 373 Identifier: ISBN: 978-3-642-45200-0