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  Phase determination in interference-based superresolving microscopes through critical frequency analysis

Hell, S. W., Blanca, C. M., & Bewersdorf, J. (2002). Phase determination in interference-based superresolving microscopes through critical frequency analysis. Optics Letters, 27(11), 888-890. Retrieved from http://www.opticsinfobase.org/viewmedia.cfm?uri=ol-27-11-888&seq=0.

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 Creators:
Hell, S. W.1, Author           
Blanca, C. M., Author
Bewersdorf, J.1, Author           
Affiliations:
1Department of NanoBiophotonics, MPI for biophysical chemistry, Max Planck Society, ou_578627              

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 Abstract: Utilizing the interference of wave fronts of two opposing lenses, 4Pi-confocal and (IM)-M-5 microscopy improve the axial resolution of far-field fluorescence microscopy as much as threefold to sevenfold. However, establishing the phase difference of the wave fronts in the sample is a problem yet to be solved. Here we show that the phase difference is encoded in the microscope's transfer of the spatial frequencies that match the distance of the interference peaks. As a result the phase difference is readily extracted through a Fourier transform of the image. Our method is relevant to all microscopes that exploit the interference of counterpropagating waves to improve the axial and the lateral resolution. (C) 2002 Optical Society of America

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Language(s): eng - English
 Dates: 2002-06-02
 Publication Status: Issued
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 Rev. Type: Peer
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Title: Optics Letters
Source Genre: Journal
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Pages: - Volume / Issue: 27 (11) Sequence Number: - Start / End Page: 888 - 890 Identifier: -