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Free keywords:
32.70.Cs, 32.30.Rj, 39.30.+w
Abstract:
A precision measurement of the lifetime of the lowest excited level of the He-like S14+ ion carried out at the Livermore EBIT-II electron beam ion trap yielded a value of (703±4) ns. Our method extends the range of lifetime measurements accessible with electron beam ion traps into the nanosecond region and improves the accuracy of currently available data for this level by an order of magnitude.