Atom Probe Tomography characterization of heavily cold drawn pearlitic steel 
wire

Li, Y. J.; Choi, P.; Borchers, C.; Chen, Y.Z.; Goto, S.; Raabe, D.; Kirchheim, R.

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Atom Probe Tomography characterization of heavily cold drawn pearlitic steel wire

Li, Y. J., Choi, P., Borchers, C., Chen, Y., Goto, S., Raabe, D., et al. (2010). Atom Probe Tomography characterization of heavily cold drawn pearlitic steel wire. Talk presented at 52nd International Field Emission Symposium (IFES). Sydney, Australia. 2010-07-05 - 2010-07-08.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-382B-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-382D-B

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Creators:
Li, Y. J.^{1, 2}, Author
Choi, P.¹, Author
Borchers, C., Author
Chen, Y.Z., Author
Goto, S.³, Author
Raabe, D.³, Author
Kirchheim, R.³, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 493345

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Title: 52nd International Field Emission Symposium (IFES)

Place of Event: Sydney, Australia

Start-/End Date: 2010-07-05 - 2010-07-08

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