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Abstract:
The potential of resonant inelastic soft x-ray scattering to measure 4f
crystal electric-field excitation spectra in Ce Kondo lattices has been
examined. Spectra have been obtained for several Ce systems and show a
well-defined structure determined by crystal-field, spin-orbit, and
charge-transfer excitations only. The spectral shapes of the excitation
spectra can be well understood in the framework of atomic multiplet
calculations. For CeCu2Si2 we found notable disagreement between the
inelastic x-ray-scattering spectra and theoretical calculations when
using the crystal-field scheme proposed from inelastic neutron
scattering. Modified sets of crystal-field parameters yield better
agreement. Our results also show that, with the very recent improvements
of soft x-ray spectrometers in resolution to below 30 meV at the Ce
M-4,M-5 edges, resonant inelastic x-ray scattering could be an ideal
tool to determine the crystal-field scheme in Ce Kondo lattices and
other rare-earth compounds.
