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Free keywords:
Scanning probe microscopy; Scanning near-field optical microscopy; Microwave microscopy; Infrared microscopy.; Resolution; Light.; Multidisciplinary.
Abstract:
A novel scanning-probe setup is reported that maps the complex transmission of microwaves. Response to topographic features as small as 15 nm was observed. The sharpened coaxial probe tip serves as a microwave antenna and, at the same time, as a tunnel tip to warrant precise distance control by STM (scanning tunneling microscope) feedback. The instrument can be applied to map the microwave conductivity of, e.g. thin films or low-dimensional semiconductors. Consequences for the development of an infrared microscope are outlined. (C) 1997 Elsevier Science Ltd. [References: 15]
