Huygens STED deconvolution increases signal-to-noise and image resolution 
towards 22 nm.

Schoonderwoert, V.; Dijkstra, R.; Lukinavicius, G.; Kobler, O.

doi:10.1017/S1551929513001089

Local TagsRelease HistoryDetailsSummary

Huygens STED deconvolution increases signal-to-noise and image resolution towards 22 nm.

Schoonderwoert, V., Dijkstra, R., Lukinavicius, G., & Kobler, O. (2013). Huygens STED deconvolution increases signal-to-noise and image resolution towards 22 nm. Microscopy Today, 21(6), 38-44. doi:10.1017/S1551929513001089.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/21.11116/0000-0001-E46E-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-E470-F

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Schoonderwoert, V., Author
Dijkstra, R., Author
Lukinavicius, G.¹, Author
Kobler, O., Author

Affiliations:
1Laboratory of Chromatin Labeling and Imaging, Max Planck Institute for Biophysical Chemistry, Max Planck Society, ou_2616691

Content

show

Details

show

hide

Language(s): eng - English

Dates: Published Online: 2013-11-05Date issued: 2013-11

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: DOI: 10.1017/S1551929513001089

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Microscopy Today

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 21 (6) Sequence Number: - Start / End Page: 38 - 44 Identifier: -