Grain boundary characterization in multicrystalline silicon using joint EBSD, 
EBIC, and atom probe tomography

Stoffers, Andreas; Cojocaru-Mirédin, Oana; Breitenstein, Otwin; Seifert, Winfried; Zaefferer, Stefan; Raabe, Dierk

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Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography

Stoffers, A., Cojocaru-Mirédin, O., Breitenstein, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. Talk presented at 40th IEEE Photovoltaic Specialists Conference. Denver, CO, USA. 2014-06-08 - 2014-06-13.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DCC1-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DCC2-B

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Creators:
Stoffers, Andreas¹, Author
Cojocaru-Mirédin, Oana¹, Author
Breitenstein, Otwin², Author
Seifert, Winfried³, Author
Zaefferer, Stefan⁴, Author
Raabe, Dierk⁵, Author

Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387
2Experimental Department II, Max-Planck-Institut für Mikrostrukturphysik, Halle, Germany, ou_persistent22
3Joint Lab IHP/BTU, Cottbus, Germany, ou_persistent22
4Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Created: 2014

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Title: 40th IEEE Photovoltaic Specialists Conference

Place of Event: Denver, CO, USA

Start-/End Date: 2014-06-08 - 2014-06-13

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