High Throughput Quantification of Grain Boundary Segregation by Correlative 
Transmission Electron Microscopy and Atom Probe Tomography

Herbig, Michael; Raabe, Dierk; Li, Yujiao; Choi, Pyuck-Pa; Zaefferer, Stefan; Goto, Shoji

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High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography

Herbig, M., Raabe, D., Li, Y., Choi, P.-P., Zaefferer, S., & Goto, S. (2014). High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography. Talk presented at International Conference on Atom Probe Tomography & Microscopy 2014. Stuttgart, Germany. 2014-08-31 - 2014-09-05.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DBF2-7 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DBF6-0

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Urheber:
Herbig, Michael¹, Autor
Raabe, Dierk², Autor
Li, Yujiao¹, Autor
Choi, Pyuck-Pa¹, Autor
Zaefferer, Stefan³, Autor
Goto, Shoji², Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
3Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391