In-situ stress measurements in Cu films using synchrotron radiation

Marx, Vera Maria; Kirchlechner, Christoph; Berger, Julia; Cordill, Megan Jo; Dehm, Gerhard

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In-situ stress measurements in Cu films using synchrotron radiation

Marx, V. M., Kirchlechner, C., Berger, J., Cordill, M. J., & Dehm, G. (2014). In-situ stress measurements in Cu films using synchrotron radiation. Talk presented at "Mechanical Issues for Flexible Electronics" Flex Workshop, Erich Schmid Institut, Leoben. Leoben, Austria. 2014-04-10 - 2014-04-11.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-A2A2-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-AE1F-1

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Urheber:
Marx, Vera Maria¹, Autor
Kirchlechner, Christoph², Autor
Berger, Julia³, Autor
Cordill, Megan Jo⁴, Autor
Dehm, Gerhard⁵, Autor

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
3Department Material Physics, Montanuniversität Leoben, Jahnstr. 12, Leoben, Austria, ou_persistent22
4Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22
5Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398