In-Situ Investigation of Creep and Creep Damage Using Synchrotron 
Microtomography

Sket, F.; Dzieciol, K.; Isaac, A.; Sauthoff, G.; Borbély, A.; Pyzalla, A. R.

Lokale TagsFreigabegeschichteDetailsÜbersicht

In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography

Sket, F., Dzieciol, K., Isaac, A., Sauthoff, G., Borbély, A., & Pyzalla, A. R. (2008). In-Situ Investigation of Creep and Creep Damage Using Synchrotron Microtomography. Talk presented at Workshop on X-Ray Micro Imaging of Materials, Devices and Organisms. Dresden, Germany. 2008-10-22 - 2008-10-24.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-459B-A Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-459D-6

Genre: Vortrag

ausblenden:

Urheber:
Sket, F.¹, Autor
Dzieciol, K.¹, Autor
Isaac, A.¹, Autor
Sauthoff, G.², Autor
Borbély, A.¹, Autor
Pyzalla, A. R.³, Autor

Affiliations:
1Synchrotron and Neutron Methods, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863366
2High Temperature Materials, Physical Metallurgy, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863396
3Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863361