Friedrich, M., Pilz, W., Sun, G. Y., Behrisch, R., García-Rosales, C., Bekris, N., et al. (2000). Tritium Depth Profiling in Carbon by Accelerator Mass Spectrometry. Nuclear Instruments and Methods in Physics Research B, 161-163, 216-220. Retrieved from http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TJN-3YTT021-1W-P&_cdi=5315&_user=100196&_orig=browse&_coverDate=03%2F31%2F2000&_sk=998389999&view=c&wchp=dGLbVlb-zSkzV&md5=3eb0bada6b4b5177443727d8a196cbf9&ie=/sdarticle.pdf.