Direkte Beobachtung von Kristalldefekten in Massivproben mittels 
Electron-Channelling Contrast Imaging (ECCI) im REM

Zaefferer, Stefan

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Direkte Beobachtung von Kristalldefekten in Massivproben mittels Electron-Channelling Contrast Imaging (ECCI) im REM

Zaefferer, S. (2016). Direkte Beobachtung von Kristalldefekten in Massivproben mittels Electron-Channelling Contrast Imaging (ECCI) im REM. Talk presented at Workshop "Von Nano bis Makro" der Europäischen Forschungsgesellschaft Dünne Schichten e.V. (EFDS). Dresden, Germany. 2016-11-07 - 2016-11-09.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-1807-C Version Permalink: https://hdl.handle.net/21.11116/0000-0002-1808-B

Genre: Talk

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Creators:
Zaefferer, Stefan¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): deu - German

Dates: Created: 2016-11

Publication Status: Not specified

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Title: Workshop "Von Nano bis Makro" der Europäischen Forschungsgesellschaft Dünne Schichten e.V. (EFDS)

Place of Event: Dresden, Germany

Start-/End Date: 2016-11-07 - 2016-11-09

Invited: Yes

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