Atom probe tomography for nanoscale analysis of nitride thin films

Povstugar, I.; Choi, P.; Tytko, D.; Raabe, D.

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Atom probe tomography for nanoscale analysis of nitride thin films

Povstugar, I., Choi, P., Tytko, D., & Raabe, D. (2012). Atom probe tomography for nanoscale analysis of nitride thin films. Talk presented at 7th International Conference on Surfaces, Coatings and Nanostructured Materials NANOSMAT-2012. Prague, Chech Republic. 2012-09-18 - 2012-09-21.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-276B-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-41FA-3

Genre: Talk

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Creators:
Povstugar, I.¹, Author
Choi, P.¹, Author
Tytko, D.¹, Author
Raabe, D.², Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Created: 2012-09

Publication Status: Not specified

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Identifiers: eDoc: 618616

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Title: 7th International Conference on Surfaces, Coatings and Nanostructured Materials NANOSMAT-2012

Place of Event: Prague, Chech Republic

Start-/End Date: 2012-09-18 - 2012-09-21

Invited: Yes

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