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  Growth and microstructural stability of epitaxial Al films on (0001) α-Al2O3 substrates

Dehm, G., Inkson, B. J., & Wagner, T. (2002). Growth and microstructural stability of epitaxial Al films on (0001) α-Al2O3 substrates. Acta Materialia, 50(20), 5021-5032.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F67-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F68-5
Genre: Journal Article
Alternative Title : Acta Mater.

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33-ar_2002.pdf (Abstract), 77KB
 
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 Creators:
Dehm, G.1, Author           
Inkson, B. J.2, Author
Wagner, T.3, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Univ Oxford, Dept Mat, Oxford OX1 3PH, England, ou_persistent22              
3Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              

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Free keywords: MPI für Metallforschung; MPI für Metallforschung; Abt. Arzt; Abt. Arzt; ZWE Dünnschichtlabor; 33-ar_2002; thin films; Al/sapphire; thermal stress; heteroepitaxy; twin boundary
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Language(s): eng - English
 Dates: 2002-12-01
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 6650
ISI: 000179478300007
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Title: Acta Materialia
  Alternative Title : Acta Mater.
Source Genre: Journal
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Pages: - Volume / Issue: 50 (20) Sequence Number: - Start / End Page: 5021 - 5032 Identifier: ISSN: 1359-6454