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  Novel comparative measurement of H- beam divergences at the BATMAN Upgrade test facility: single beamlet and a group of beamlets

Wimmer, C., Bonomo, F., Hurlbatt, A., Schiesko, L., Fantz, U., Heinemann, B., et al. (2019). Novel comparative measurement of H- beam divergences at the BATMAN Upgrade test facility: single beamlet and a group of beamlets. Poster presented at 18th International Conference on Ion Sources (ICIS 2019), Lanzhou.

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 Creators:
Wimmer, C.1, Author           
Bonomo, F.1, Author           
Hurlbatt, A.1, Author           
Schiesko, L.1, Author           
Fantz, U.1, Author           
Heinemann, B.1, Author           
Orozco, G.1, Author           
Agostini, M.2, Author
Barbisan, M.2, Author
Brombin, M.2, Author
Delogu, R.2, Author
Pimazzoni, A.2, Author
Serianni, G.2, Author
Ugoletti, M.2, Author
Veltri, P.2, Author
Affiliations:
1ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856290              
2External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2019
 Publication Status: Submitted
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 18th International Conference on Ion Sources (ICIS 2019)
Place of Event: Lanzhou
Start-/End Date: 2019-09-01 - 2019-09-06

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