Ion Beam Analysis of Samples from Fusion Devices and Needs for Advanced 
Simulations

Mayer, M.

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Ion Beam Analysis of Samples from Fusion Devices and Needs for Advanced Simulations

Mayer, M. (2018). Ion Beam Analysis of Samples from Fusion Devices and Needs for Advanced Simulations. Talk presented at Technical Meeting on Advanced Methodologies for the Analysis of Materials in Energy Applications Using Ion Beam Accelerators. Vienna. 2018-10-08 - 2018-10-11.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-5A66-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-5A67-6

Genre: Talk

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Creators:
Mayer, M.¹, Author

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): eng - English

Dates: Submitted: 2018

Publication Status: Submitted

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Title: Technical Meeting on Advanced Methodologies for the Analysis of Materials in Energy Applications Using Ion Beam Accelerators

Place of Event: Vienna

Start-/End Date: 2018-10-08 - 2018-10-11

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