Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 
nanoparticles doped PVDF thin films for future application of organic 
ferroelectric junctions

Al-Hazmi, F. S.; de Leeuw, Dago M.; Al-Ghamdi, A. A.; Shokr, F. S.

doi:10.1016/j.ijleo.2017.03.073

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Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions

Al-Hazmi, F. S., de Leeuw, D. M., Al-Ghamdi, A. A., & Shokr, F. S. (2017). Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions. Optik, 138, 207-213. doi:10.1016/j.ijleo.2017.03.073.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-87BF-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-87C5-A

Genre: Journal Article

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Al-Hazmi, F. S., Author
de Leeuw, Dago M.¹, Author
Al-Ghamdi, A. A., Author
Shokr, F. S., Author

Affiliations:
1Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society, ou_1800284

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Language(s): eng - English

Dates: Date issued: 2017

Publication Status: Issued

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Identifiers: DOI: 10.1016/j.ijleo.2017.03.073

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Title: Optik

Source Genre: Journal

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Publ. Info: Stuttgart : Urban & Fischer

Pages: - Volume / Issue: 138 Sequence Number: - Start / End Page: 207 - 213 Identifier: ISSN: 0030-4026
CoNE: https://pure.mpg.de/cone/journals/resource/954925430331