Breakdown of ultrathin anodic valve metal oxide films in 
metal-insulator-metal-contacts compared with metal-insulator-electrolyte 
contacts

Hassel, A. W.; Diesing, D.

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Breakdown of ultrathin anodic valve metal oxide films in metal-insulator-metal-contacts compared with metal-insulator-electrolyte contacts

Hassel, A. W., & Diesing, D. (2002). Breakdown of ultrathin anodic valve metal oxide films in metal-insulator-metal-contacts compared with metal-insulator-electrolyte contacts. Thin Solid Films, 414, 296-303.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6F03-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6F05-A

Genre: Journal Article

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Creators:
Hassel, A. W.¹, Author
Diesing, D., Author

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355

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Language(s): eng - English

Dates: Date issued: 2002

Publication Status: Issued

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Identifiers: eDoc: 12917

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Title: Thin Solid Films

Source Genre: Journal

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Pages: - Volume / Issue: 414 Sequence Number: - Start / End Page: 296 - 303 Identifier: -