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  Mapping of Sn dopant in hematite photoanodes by STEM-EELS and atom probe tomography

Zhang, S., Li, T., Gault, B., Hufnagel, A., Hoffmann, R., Harzer, T., et al. (2017). Mapping of Sn dopant in hematite photoanodes by STEM-EELS and atom probe tomography. Poster presented at EDGE 2017: Enhanced Data Generated by Electrons, 8th International Workshop on Electron Energy Loss Spectroscopy and Related Techniques, Okuma, Okinawa, Japan.

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 Creators:
Zhang, Siyuan1, Author           
Li, Tong2, Author           
Gault, Baptiste2, Author           
Hufnagel, Alexander3, Author           
Hoffmann, Ramona4, Author           
Harzer, Tristan4, Author           
Breitbach, Benjamin5, Author           
Fattakhova-Rohlfing, Dina3, Author           
Bein, Thomas3, Author           
Scheu, Christina1, Author           
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
3Department of Chemistry and Center for NanoScience (CeNS), Ludwig-Maximilians- Universität München, Butenandtstr. 5-11, D-81377 Munich, Germany, ou_persistent22              
4Department of Chemistry and Center for NanoScience (CeNS), University of Munich (LMU), Butenandtstraße 5-13, 81377 Munich, Germany, persistent22              
5Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2017-05-15
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
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Title: EDGE 2017: Enhanced Data Generated by Electrons, 8th International Workshop on Electron Energy Loss Spectroscopy and Related Techniques
Place of Event: Okuma, Okinawa, Japan
Start-/End Date: 2017-05-15

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