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Schlagwörter:
Mechanical testing; Polymer films; Polymers; Synchrotrons; X ray diffraction, Beam lines; Biaxial tests; Deformation mechanism; Digital image correlations; Flexible substrate; Mechanical behavior; Nanoscale thickness; Polymer substrate, Thin films
Zusammenfassung:
This article illustrates the implementation of biaxial tests of thin films of nanoscale thickness on flexible substrates (polymers). Biaxial machine has been developed for this purpose and is located within the DIFFABS beamline at Soleil synchrotron. This is combined with techniques for measuring strain, as the X-ray diffraction and the Digital Image Correlation. We show that this ensemble can probe the mechanical behavior of thin films, from elasticity to fissuration, with extra clues to the deformation mechanisms. © 2015 EDP Sciences.
