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  Structural characterization of ZrO2 thin films produced via self-assembled monolayer-mediated deposition from aqueous dispersions

Polli, A. D., Wagner, T., Fischer, A., Weinberg, G., Jentoft, F. C., Schlögl, R., et al. (2000). Structural characterization of ZrO2 thin films produced via self-assembled monolayer-mediated deposition from aqueous dispersions. Thin Solid Films, 379, 122-127.

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 Creators:
Polli, A. D., Author
Wagner, T.1, Author           
Fischer, A., Author
Weinberg, G., Author
Jentoft, F. C., Author
Schlögl, R., Author
Rühle, M.2, Author           
Affiliations:
1Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Metallforschung; Fritz-Haber-Institut; Abt. Rühle; Abt. Arzt; ZWE Dünnschichtlabor;
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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 198972
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Title: Thin Solid Films
Source Genre: Journal
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Pages: - Volume / Issue: 379 Sequence Number: - Start / End Page: 122 - 127 Identifier: -