Hardness-depth profiling on nanometer scale

Kunert, M.; Baretzky, B.; Baker, S. P.; Mittemeijer, E. J.

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Hardness-depth profiling on nanometer scale

Kunert, M., Baretzky, B., Baker, S. P., & Mittemeijer, E. J. (2001). Hardness-depth profiling on nanometer scale. Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science, 32(5), 1201-1209.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3512-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3513-0

Genre: Journal Article

Alternative Title : Metall. Mater. Trans. A-Phys. Metall. Mater. Sci.

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Creators:
Kunert, M.¹, Author
Baretzky, B.^{1, 2}, Author
Baker, S. P.³, Author
Mittemeijer, E. J.^{1, 4}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648
3Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA, ou_persistent22
4Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Language(s): eng - English

Dates: Date issued: 2001-05

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 21408
ISI: 000168519600017

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Title: Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science

Alternative Title : Metall. Mater. Trans. A-Phys. Metall. Mater. Sci.

Source Genre: Journal

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Pages: - Volume / Issue: 32 (5) Sequence Number: - Start / End Page: 1201 - 1209 Identifier: ISSN: 1073-5623