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  Charge fluctuations and image potential at oxide-metal interfaces

Altieri, S., Tjeng, L. H., Voogt, F. C., Hibma, T., Rogojanu, O., & Sawatzky, G. A. (2002). Charge fluctuations and image potential at oxide-metal interfaces. Physical Review B, 66(15): 155432, pp. 1-6. doi:10.1103/PhysRevB.66.155432.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-1770-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-1772-9
Genre: Journal Article

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 Creators:
Altieri, S.1, Author
Tjeng, L. H.2, Author           
Voogt, F. C.1, Author
Hibma, T.1, Author
Rogojanu, O.1, Author
Sawatzky, G. A.1, Author
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1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: We analyze the dynamical response of the Ag metal surface to electronic excitations in a MgO(100)/Ag(100) oxide-metal interface system. Intrinsic and extrinsic surface plasmon excitations are discussed in relation to mutual interactions between the oxide and the metal. A direct relationship is established between the reduction of charge fluctuation energies in the MgO(100) layers and the image charge screening by the Ag(100) metal surface.

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 Dates: 2002-10-31
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000179080800151
DOI: 10.1103/PhysRevB.66.155432
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Title: Physical Review B
  Other : Phys. Rev. B
Source Genre: Journal
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Publ. Info: Woodbury, NY : American Physical Society
Pages: - Volume / Issue: 66 (15) Sequence Number: 155432 Start / End Page: 1 - 6 Identifier: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008