In-situ squared: multi property thin film measurements during straining

Cordill, M. J.; Glushko, O.; Kreith, J.; Marx, V. M.; Kirchlechner, C.; Zizak, I.; Struntz, T.; Fantner, E.

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In-situ squared: multi property thin film measurements during straining

Cordill, M. J., Glushko, O., Kreith, J., Marx, V. M., Kirchlechner, C., Zizak, I., et al. (2013). In-situ squared: multi property thin film measurements during straining. Talk presented at Nano- and Micromechanical Testing in Materials Research and Development IV. Olhão, Portugal. 2013-10-06 - 2013-10-11.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-210E-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-D2CB-D

Genre: Talk

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Creators:
Cordill, M. J.¹, Author
Glushko, O.¹, Author
Kreith, J., Author
Marx, V. M.², Author
Kirchlechner, C.³, Author
Zizak, I., Author
Struntz, T., Author
Fantner, E., Author

Affiliations:
1Max Planck Society, ou_persistent13
2Structure and Micro-/Nanomechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
3Nano-/Micromechanics of Materials, Structure and Micro-/Nanomechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401

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Language(s): eng - English

Dates: Created: 2013

Publication Status: Not specified

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Identifiers: eDoc: 681731

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Title: Nano- and Micromechanical Testing in Materials Research and Development IV

Place of Event: Olhão, Portugal

Start-/End Date: 2013-10-06 - 2013-10-11

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