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  Reduction of phase singularities in speckle-shearing interferometry by incoherent averaging of speckle patterns

Mantel, K., Nercissian, V., & Lindlein, N. (2015). Reduction of phase singularities in speckle-shearing interferometry by incoherent averaging of speckle patterns. In OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA: SPIE-INT SOC OPTICAL ENGINEERING. doi:10.1117/12.2184580.

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 Creators:
Mantel, K.1, Author           
Nercissian, Vanusch1, Author           
Lindlein, N.1, Author           
Affiliations:
1Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364704              

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Free keywords: Instruments & Instrumentation; Optics; Physics; Speckle-shearing interferometry; phase singularities; incoherent averaging;
 Abstract: Speckle interferometry is a well established technique for the optical characterization of rough objects, with the quantification of deformations as one particular application of interest. Owing to its common path property, a speckle-shearing interferometer is often the natural choice as a setup. Like other speckle techniques, however, speckle-shearing interferometry suffers from the existence of phase singularities present in the speckle patterns. Phase singularities introduce ambiguities into the phase unwrapping process and make this evaluation step highly sophisticated. In this work, we attempt to reduce the number of phase singularities by physical means, i. e. by applying an incoherent averaging of multiple, mutually independent speckle intensities. The effect of the incoherent averaging on the number of phase singularities has been investigated theoretically, by computer simulations, and experimentally To obtain high contrast fringes in connection with a shearing setup, which would not be the case for a simple extended light source, a periodically structured light source with a period matched to the shear distance is applied. It turns out that the number of phase singularities may indeed be reduced, but only to a certain extent.

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Language(s): eng - English
 Dates: 2015
 Publication Status: Published online
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000357981400024
DOI: 10.1117/12.2184580
 Degree: -

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Title: Conference on Optical Measurement Systems for Industrial Inspection IX
Place of Event: Munich, GERMANY
Start-/End Date: 2015-06-22 - 2015-06-25

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Title: OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX
  Alternative Title : PROC SPIE
Source Genre: Proceedings
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Publ. Info: 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA : SPIE-INT SOC OPTICAL ENGINEERING
Pages: SPIE Volume / Issue: - Sequence Number: 95250U Start / End Page: - Identifier: ISSN: 0277-786X
ISBN: 978-1-62841-685-5

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Title: Proceedings of SPIE
  Alternative Title : PROC SPIE
Source Genre: Series
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Publ. Info: -
Pages: - Volume / Issue: 9525 Sequence Number: - Start / End Page: - Identifier: ISSN: 0277-786X