3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning 
Electron Microscope: A New Dimension of Microstructure Characterisation

Zaefferer, S.; Konrad, J.; Raabe, D.

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3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation

Zaefferer, S., Konrad, J., & Raabe, D. (2005). 3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation. Talk presented at Microscopy Conference 2005. Davos, Switzerland. 2005-08-08 - 2005-09-02.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5ED1-3 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5ED3-0

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Urheber:
Zaefferer, S.¹, Autor
Konrad, J.^{1, 2}, Autor
Raabe, D.³, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Development and Characterization of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381