Tip preparation for usage in an ultra-low temperature UHV scanning tunneling 
microscope

Ernst, S.; Wirth, S.; Rams, M.; Dolocan, V.; Steglich, F.

doi:10.1016/j.stam.2007.05.008

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Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope

Ernst, S., Wirth, S., Rams, M., Dolocan, V., & Steglich, F. (2007). Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope. Science and Technology of Advanced Materials, 8, 347-351. doi:10.1016/j.stam.2007.05.008.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-293B-1 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-F124-B

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Urheber:
Ernst, S.¹, Autor
Wirth, S.², Autor
Rams, M.¹, Autor
Dolocan, V.¹, Autor
Steglich, F.³, Autor

Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404
2Steffen Wirth, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863460
3Frank Steglich, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863467