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  All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Rashidi, M., Vine, W., Burgess, J. A. J., Taucer, M., Achal, R., Pitters, J. L., et al. (2018). All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics. Journal of Visualized Experiments, 131: e56861. doi:10.3791/56861.

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1706.08906.pdf (Preprint), 966KB
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2017
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externe Referenz:
https://dx.doi.org/10.3791/56861 (Verlagsversion)
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https://arxiv.org/abs/1706.08906 (Preprint)
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 Urheber:
Rashidi, M.1, 2, Autor
Vine, W.1, Autor
Burgess, J. A. J.3, 4, 5, Autor           
Taucer, M.1, 2, 6, Autor
Achal, R.1, Autor
Pitters, J. L.2, Autor
Loth, S.3, 4, Autor           
Wolkow, R. A.1, 2, Autor
Affiliations:
1Department of Physics, University of Alberta, ou_persistent22              
2National Institute for Nanotechnology, National Research Council of Canada, Edmonton, ou_persistent22              
3Dynamics of Nanoelectronic Systems, Independent Research Groups, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938290              
4Max Planck Institute for Solid State Research, ou_persistent22              
5Department of Physics and Astronomy, University of Manitoba, ou_persistent22              
6Joint Attosecond Science Laboratory, University of Ottawa, ou_persistent22              

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 Zusammenfassung: The miniaturization of semiconductor devices to scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants requires sub-nanometer spatial resolution, which motivates the use of scanning tunneling microscopy (STM). However, conventional STM is limited to millisecond temporal resolution. Several methods have been developed to overcome this shortcoming, including all-electronic time-resolved STM, which is used in this study to examine dopant dynamics in silicon with nanosecond resolution. The methods presented here are widely accessible and allow for local measurement of a wide variety of dynamics at the atomic scale. A novel time-resolved scanning tunneling spectroscopy technique is presented and used to efficiently search for dynamics.

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Sprache(n): eng - English
 Datum: 2018-01
 Publikationsstatus: Online veröffentlicht
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.3791/56861
arXiv: 1706.08906
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Titel: Journal of Visualized Experiments
  Andere : Journal of Visualized Experiments: JoVE
  Kurztitel : J. Vis. Exp.
Genre der Quelle: Zeitschrift
 Urheber:
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Ort, Verlag, Ausgabe: Rockville Pike, Bethesda MD : JoVE
Seiten: - Band / Heft: 131 Artikelnummer: e56861 Start- / Endseite: - Identifikator: ISSN: 1940-087X
CoNE: https://pure.mpg.de/cone/journals/resource/1940087X