Effect of edge threading dislocations on the electronic structure of InN

Kalesaki, E.; Kioseoglou, J; Lymperakis, L.; Komninou, P.; Karakostas, T.

doi:10.1063/1.3553772

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Effect of edge threading dislocations on the electronic structure of InN

Kalesaki, E., Kioseoglou, J., Lymperakis, L., Komninou, P., & Karakostas, T. (2011). Effect of edge threading dislocations on the electronic structure of InN. Applied Physics Letters, 98(7), 072103-1-072103-3. doi:10.1063/1.3553772.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-334D-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-334F-5

Genre: Journal Article

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Kalesaki, E., Author
Kioseoglou, J, Author
Lymperakis, L.¹, Author
Komninou, P., Author
Karakostas, T., Author

Affiliations:
1Microstructure, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863344

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Language(s): eng - English

Dates: Date issued: 2011-02-14

Publication Status: Issued

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Identifiers: eDoc: 528735
DOI: 10.1063/1.3553772

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Title: Applied Physics Letters

Alternative Title : Appl. Phys. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 98 (7) Sequence Number: - Start / End Page: 072103-1 - 072103-3 Identifier: -