Calibrating yield surface models based on full yield crystal plasticity 
simulations

Roters, Franz; Han, Fengbo

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Calibrating yield surface models based on full yield crystal plasticity simulations

Roters, F., & Han, F. (2019). Calibrating yield surface models based on full yield crystal plasticity simulations. Talk presented at M2i conference 'Meeting Materials'. Noordwijkerhout, The Netherlands. 2019-12-10.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0005-7263-B Versions-Permalink: https://hdl.handle.net/21.11116/0000-0005-7264-A

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Urheber:
Roters, Franz¹, Autor
Han, Fengbo¹, Autor

Affiliations:
1Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392