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  Statistical Reliability of Phase Fraction Determination Based on Electron Backscatter Diffraction (EBSD) Investigations on the Example of an Al-TRIP Steel

Davut, K., & Zaefferer, S. (2010). Statistical Reliability of Phase Fraction Determination Based on Electron Backscatter Diffraction (EBSD) Investigations on the Example of an Al-TRIP Steel. Metallurgical and Materials Transactions A, 41(9), 2187-2196. doi:10.1007/s11661-010-0315-2.

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 Creators:
Davut, K.1, Author           
Zaefferer, S.1, Author           
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 494486
DOI: 10.1007/s11661-010-0315-2
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Title: Metallurgical and Materials Transactions A
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 41 (9) Sequence Number: - Start / End Page: 2187 - 2196 Identifier: -